Paper
13 November 2001 Integrated micro 4f-optical imaging system for the characteriztion of mesoscopic DOEs
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Abstract
In this paper we present the design and characterization of a micro 4f optical imaging system for the purpose of characterizing mesoscopic diffractive optical elements. To this end, we demonstrate the systems' ability to measure very small variation sin diffraction intensity with high resolution. Because the system is illuminated by both coherent and incoherent sources, we characterize the cutoff frequency and modulation transfer function to determine the spatial resolution of the system. The system is validated by comparing measured results to theoretical predictions.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiao Gao, Jonathan Bates, David Pustai, and Dennis W. Prather "Integrated micro 4f-optical imaging system for the characteriztion of mesoscopic DOEs", Proc. SPIE 4437, Gradient Index, Miniature, and Diffractive Optical Systems II, (13 November 2001); https://doi.org/10.1117/12.448155
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Cited by 1 scholarly publication.
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KEYWORDS
Imaging systems

Spatial frequencies

Objectives

Modulation transfer functions

Charge-coupled devices

Diffraction

Modulation

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