Paper
26 December 2001 Moire fringes affected by two inclined gratings in Talbot interferometry
Qian Liu, Ryoji Ohba
Author Affiliations +
Abstract
A more actual situation is studied on the effects of both inclined grating planes in Talbot interferometry illuminated by a plane wave. In the situation, the two grating planes are first rotated around their own axis parallel to the line direction, and then detector grating is rotated by an angle around the normal of the grating plane. Theoretical analyses indicate that the tilt-angle of the moire fringes is sensitive to the inclination. The results in this paper are also compared with those in one of our earlier works.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qian Liu and Ryoji Ohba "Moire fringes affected by two inclined gratings in Talbot interferometry", Proc. SPIE 4438, Physics, Theory, and Applications of Periodic Structures in Optics, (26 December 2001); https://doi.org/10.1117/12.451490
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KEYWORDS
Interferometry

Sensors

Commercial off the shelf technology

Moire patterns

Transmittance

Beam propagation method

Beam splitters

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