You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
3 November 1983Interferometric Method For Optical Testing And Wavefront Error Sensing
A new interferometric method for optical testing has been developed. The test arrangement is similar to that of the Hartmann method using a screen with a rectangular grid of holes. The detection takes place close to the focus where the Hartmann images are partly overlapping and interfering. The positions of the interference maxima contain information on the wavefront errors of the optical system. As the size of the interference maxima is considerably smaller than the size of the Hartmann images obtained with the same screen, the accuracy of the position measurements is respectively better. Also much smaller hole spacing can be used. An application of the method could be wavefront error sensing in active optical systems. A CCD camera could ideally be used as detector for the measurement of the wavefront errors and for generating the error signals to the active optical system.
Tapio K. Korhonen
"Interferometric Method For Optical Testing And Wavefront Error Sensing", Proc. SPIE 0444, Advanced Technology Optical Telescopes II, (3 November 1983); https://doi.org/10.1117/12.937983
The alert did not successfully save. Please try again later.
Tapio K. Korhonen, "Interferometric Method For Optical Testing And Wavefront Error Sensing," Proc. SPIE 0444, Advanced Technology Optical Telescopes II, (3 November 1983); https://doi.org/10.1117/12.937983