New XRMF spectrometer with high resolution and high efficiency using polycapillary x-ray lens and PSPC+

Xunliang Ding; Yiming Yan; Qiuli Pan; Yumei Yan; Yejun He

doi:10.1117/12.450221

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13 December 2001 New XRMF spectrometer with high resolution and high efficiency using polycapillary x-ray lens and PSPC+

Xunliang Ding, Yiming Yan, Qiuli Pan, Yumei Yan, Yejun He

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Proceedings Volume 4499, X-Ray Micro- and Nano-Focusing: Applications and Techniques II; (2001) https://doi.org/10.1117/12.450221
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

A new spectrometer based on plane crystal wavelength dispersive method using a position sensitive proportional counter (PSPC) in conjunction with x-ray microbeam formed by monolithic polycapillary x-ray focusing lens has been developed. The new spectrometer could be used for XRMF analysis with high sensitivity, high spatial resolution and energy resolution simultaneously. The minimum spot sizes of the Cu-K(alpha) focused by the lens was 50micrometers . The energy resolution of 5.8 eV was obtained for Ti-K(alpha) by means of the spectrometer.

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Xunliang Ding, Yiming Yan, Qiuli Pan, Yumei Yan, and Yejun He "New XRMF spectrometer with high resolution and high efficiency using polycapillary x-ray lens and PSPC+", Proc. SPIE 4499, X-Ray Micro- and Nano-Focusing: Applications and Techniques II, (13 December 2001); https://doi.org/10.1117/12.450221

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