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6 December 2001 Compact crystalline phase monitor for the steel industry
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Abstract
This paper describes the development of a prototype in-line process monitor for galvannealing processes in the steel industry using parallel beam X-ray diffraction. The implementation of this is to design a simplified X-ray diffraction system monitoring a single phase (FeZn (xi) phase)of the steel surface coating during the galvannealing process. A laboratory base system was built with a low power source combined with a polycapillary collimating optic. Data sets from several steel samples were collected and analyzed. Two-dimensional polycapillary angular filters were used in this system and show that they could increase the single-noise ratio. Data acquisition times were also estimate to detect a change in phase composition. The direction of future work and system improvements for in-line application is also discussed.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huapeng Huang, Caiyun Chen, Zewu Chen, and Tom Bievenue "Compact crystalline phase monitor for the steel industry", Proc. SPIE 4502, Advances in Laboratory-based X-Ray Sources and Optics II, (6 December 2001); https://doi.org/10.1117/12.449858
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