In-line phase contrast in synchrotron-radiation microradiography and tomography

Timm Weitkamp; Christoph Rau; Anatoly A. Snigirev; Boris Benner; Til Florian Guenzler; Marion Kuhlmann; Christian G. Schroer

doi:10.1117/12.452832

7 January 2002 In-line phase contrast in synchrotron-radiation microradiography and tomography

Timm Weitkamp, Christoph Rau, Anatoly A. Snigirev, Boris Benner, Til Florian Guenzler, Marion Kuhlmann, Christian G. Schroer

Author Affiliations +

Proceedings Volume 4503, Developments in X-Ray Tomography III; (2002) https://doi.org/10.1117/12.452832
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

When used in microimaging, hard x rays from third-generation synchrotron radiation (SR) sources inevitably generate noninterferometric or in-line phase contrast. It is formed by the propagation of a distorted x-ray wavefront after the sample. In this paper, we discuss phase contrast and its properties in two altogether different experimental modes. First, in edge-enhanced microtomography, we show by phase- propagation simulations that local tomography is possible without special effort. The second part of the paper discusses phase contrast and phase artifacts in magnified x- ray imaging and tomography using refractive lenses. Here, the phase effects degrade resolution to a considerable extent. This part of the paper contains experimental results from the ESRF beamline ID 22 in the photon energy range around 20 keV that are compared to simulated images and to experimental results from conventional high-resolution microtomography. The experimental results show that coherence-degrading devices can reduce but not completely eliminate phase effects, and recent microtomography data gathered with an x-ray microscope still cannot beat conventional state-of-the-art high-resolution microtomography with micrometer resolution.

Citation Download Citation

Timm Weitkamp, Christoph Rau, Anatoly A. Snigirev, Boris Benner, Til Florian Guenzler, Marion Kuhlmann, and Christian G. Schroer "In-line phase contrast in synchrotron-radiation microradiography and tomography", Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); https://doi.org/10.1117/12.452832

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available