Paper
14 November 2001 Soft x-ray and EUV emission from cryogenic liquid jets irradiated with fs, ps, and ns laser pulses
Marek Wieland, Manfred Faubel, Martin Schmidt, Ulrich Vogt, Thomas Wilhein
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Abstract
Cryogenic liquid jets of either nitrogen or argon of up to 30 micrometer in diameter were exposed to intense laser fields with pulse durations between 70 fs and 3 ns leading to intensities of 1016 W cm-2 and 1013 W cm-2, respectively. The emission of extreme UV light and soft X-rays investigated by means of an absolutely calibrated soft X-ray spectrograph shows the characteristic lines of highly ionized nitrogen and argon atoms. For nitrogen the emitted photon flux at the longer pulse length was several orders of magnitude higher than for 70 fs pulses whereas for argon pulse durations around one ps lead to the highest conversion efficiency (CE) from laser to soft X-ray radiation.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marek Wieland, Manfred Faubel, Martin Schmidt, Ulrich Vogt, and Thomas Wilhein "Soft x-ray and EUV emission from cryogenic liquid jets irradiated with fs, ps, and ns laser pulses", Proc. SPIE 4504, Applications of X Rays Generated from Lasers and Other Bright Sources II, (14 November 2001); https://doi.org/10.1117/12.448479
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Cited by 2 scholarly publications and 1 patent.
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KEYWORDS
Argon

Liquids

Nitrogen

Picosecond phenomena

Pulsed laser operation

Plasma

Extreme ultraviolet

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