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18 December 2001 Surface treatments and their effects on the performance of Cd1-x ZnxTe radiation detectors
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Abstract
Detector grade, charge compensated Cd1-xZnxTe (CZT) crystals were treated by mechanical polishing, chemical solution etching, and radio-frequency gold sputtering. The crystals and detectors were next studied using direct current (DC) photoconductivity and low-temperature photoluminescence (PL). The DC photocurrent was analyzed with a steady state continuity equation and the results were correlated with PL and gamma-ray detector performance tests. The dependence of the electron lifetime on the light intensity of the CZT detector was consistent with a Shockley-Read one-center model. It was found that the surface recombination velocities, the effective mobility-lifetime products, and gamma-ray performances of CZT crystals are modified dramatically by the choice of chemical etchant.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yunlong Cui, G. Wright, K. Kolokolnikov, C. Barnett, K. Reed, U. N. Roy, Arnold Burger, and Ralph B. James "Surface treatments and their effects on the performance of Cd1-x ZnxTe radiation detectors", Proc. SPIE 4507, Hard X-Ray and Gamma-Ray Detector Physics III, (18 December 2001); https://doi.org/10.1117/12.450751
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