Direct-conversion x-ray imaging detectors for medical nondestructive testing (NDT) and other applications

Denny L. Y. Lee; Kelly P. Golden; Jeffrey G. Yorker; Brian G. Rodricks; Lawrence K. Cheung; Lothar S. Jeromin

doi:10.1117/12.450782

19 December 2001 Direct-conversion x-ray imaging detectors for medical nondestructive testing (NDT) and other applications

Denny L. Y. Lee, Kelly P. Golden, Jeffrey G. Yorker, Brian G. Rodricks, Lawrence K. Cheung, Lothar S. Jeromin

Author Affiliations +

Proceedings Volume 4508, Penetrating Radiation Systems and Applications III; (2001) https://doi.org/10.1117/12.450782
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Direct conversion of x-ray energy into electrical charge has been extensively developed into imaging products in the past few years. Applications include general radiography, mammography, x-ray crystallography, portal imaging, and non-destructive testing. Direct methods avoid intermediate conversion of x-rays into light prior to generating a measurable electrical charge. This eliminates light scattering effects on image sharpness, allowing detectors to be designed to the limit of the theoretical modulation transfer function for a discrete-pixel sensor. Working exposure range can be customized by adjusting bias and thickness of sensor layers in coordination with readout-electronics specifications. Mature amorphous selenium technology and recent progress on high-quality Thin-Film Transistor (TFT) arrays for computer displays have allowed development of practical large-area high-resolution flat-panel x-ray imaging systems. A variety of design optimizations enable direct-conversion technology to satisfy a wide range of applications.

Citation Download Citation

Denny L. Y. Lee, Kelly P. Golden, Jeffrey G. Yorker, Brian G. Rodricks, Lawrence K. Cheung, and Lothar S. Jeromin "Direct-conversion x-ray imaging detectors for medical nondestructive testing (NDT) and other applications", Proc. SPIE 4508, Penetrating Radiation Systems and Applications III, (19 December 2001); https://doi.org/10.1117/12.450782

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