Electrical properties of polycrystalline mercuric iodide x-ray detectors

Haim Hermon; Robert A. Street; Leonid Melekhov; Asaf Zuck; Alexander I. Vilensky; Steve E. Ready; George Zentai; Michael M. Schieber; Larry D. Partain

doi:10.1117/12.450792

19 December 2001 Electrical properties of polycrystalline mercuric iodide x-ray detectors

Haim Hermon, Robert A. Street, Leonid Melekhov, Asaf Zuck, Alexander I. Vilensky, Steve E. Ready, George Zentai, Michael M. Schieber, Larry D. Partain

Author Affiliations +

Proceedings Volume 4508, Penetrating Radiation Systems and Applications III; (2001) https://doi.org/10.1117/12.450792
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

New results for polycrystalline HgI2 detectors are reported here. Due to its decent electrical properties and high stopping power for X-rays and gamma rays, HgI₂ is a good candidate for many medical imaging applications. HgI₂ were deposited by a hot wall Physical Vapor Deposition (PVD) method, and the electrical properties of the films, including X-ray response and dark current data are reported. Results of imaging capabilities and spatial resolution obtained by polycrystalline HgI₂ deposited onto a 2'x2' TFT imaging array on an amorphous silicon substrate are also given. These tests were carried out at Xerox-PARC Research Center.

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Haim Hermon, Robert A. Street, Leonid Melekhov, Asaf Zuck, Alexander I. Vilensky, Steve E. Ready, George Zentai, Michael M. Schieber, and Larry D. Partain "Electrical properties of polycrystalline mercuric iodide x-ray detectors", Proc. SPIE 4508, Penetrating Radiation Systems and Applications III, (19 December 2001); https://doi.org/10.1117/12.450792

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