Characteristics of neutron multilayer devices from ray-tracing calculations

Anand M. Saxena

doi:10.1117/12.448072

8 November 2001 Characteristics of neutron multilayer devices from ray-tracing calculations

Anand M. Saxena

Proceedings Volume 4509, Neutron Optics; (2001) https://doi.org/10.1117/12.448072
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Characteristics of a neutron focusing device based on five thin-film multilayers that are (1) oriented at slightly different angles with respect to the mean ray to converge the neutron beam reflected by each individual section, (2) have slightly different d-spacings such that the neutron beam reflected by each section has the same mean wavelength, were evaluated using a Monte Carlo program for a number of geometries. The influence of changing the distance between the focusing device and the detector was studied,and the effect of small deviations from the desired values was also explored.

Citation Download Citation

Anand M. Saxena "Characteristics of neutron multilayer devices from ray-tracing calculations", Proc. SPIE 4509, Neutron Optics, (8 November 2001); https://doi.org/10.1117/12.448072

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