Translator Disclaimer
Paper
4 October 2001 Development of a phase (contrast) reversal speckle interferometric system for in-plane displacement measurement with two-fold sensitivity
Author Affiliations +
Proceedings Volume 4564, Optomechatronic Systems II; (2001) https://doi.org/10.1117/12.444108
Event: Intelligent Systems and Advanced Manufacturing, 2001, Boston, MA, United States
Abstract
A phase reversal speckle interferometric (PRSI) system is developed for precise measurement of in-plane displacement component of a deformation vector with twofold measuring sensitivity. In the system, the phase reversal is accomplished by varying the pressure within an air field quartz cell inserted in one of the observation arms of a dual beam symmetric illumination-observation arrangement. The work reported here is classified into two parts: the first part illustrates a novel real-time phase reversal speckle photography technique for exact π-phase shift calibration using a two wave coupling arrangement in a BaTiO3 photorefractive crystal as a recording medium. The second part consists of simultaneously providing object deformation and an exact phase shift of π between the exposures using PRSI system to achieve twofold measuring sensitivity.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nandigana K. Krishna Mohan "Development of a phase (contrast) reversal speckle interferometric system for in-plane displacement measurement with two-fold sensitivity", Proc. SPIE 4564, Optomechatronic Systems II, (4 October 2001); https://doi.org/10.1117/12.444108
PROCEEDINGS
9 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

A real time phase reversal read out system with BaTiO3...
Proceedings of SPIE (September 20 2005)
Phase Conjugate Interferometry
Proceedings of SPIE (April 22 1988)
Deformation studies with BaTiO3 Crystal as a recording medium
Proceedings of SPIE (December 12 1994)
Novel interferometry for crystal thickness measurement
Proceedings of SPIE (January 17 2008)

Back to Top