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18 June 2002 Graded-index profile analysis from M-line, optical polarimetry, and EDS measurements of glass waveguides produced by K+/Ag+ ion-exchange combinations
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Proceedings Volume 4640, Integrated Optics: Devices, Materials, and Technologies VI; (2002) https://doi.org/10.1117/12.433249
Event: Symposium on Integrated Optoelectronic Devices, 2002, San Jose, California, United States
Abstract
Direct near-surface (DNS) and m-line techniques for the measurement of surface refractive index of ion-exchanged waveguides are compared. Measurements are also compared to direct investigation of ion concentration profiles by energy dispersion spectroscopy (EDS). Good agreement is obtained for the Ag+, K+, and Ag++K+ exchanged samples, but not for the K++Ag+ sample. The index profile approximately follows in a linear proportion the concentration profile after a single Ag+-exchange, while this is not observed for all other samples involving K+-exchange. These results on ion-exchange and refractive-index profiles are discussed, towards a comprehensive and accurate characterization of graded-index waveguides.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stefano Pelli, Giancarlo C. Righini, Marcelo Barbalho Pereira, and Flavio Horowitz "Graded-index profile analysis from M-line, optical polarimetry, and EDS measurements of glass waveguides produced by K+/Ag+ ion-exchange combinations", Proc. SPIE 4640, Integrated Optics: Devices, Materials, and Technologies VI, (18 June 2002); https://doi.org/10.1117/12.433249
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