Simple and effective technique for the evaluation of optical field emitted from a SNOM probe tip

Takashi Fukuda; Kimio Sumaru; Yoshihito Narita; Tsutomu Inoue; Fuminori Sato; Hiro Matsuda

doi:10.1117/12.470450

13 June 2002 Simple and effective technique for the evaluation of optical field emitted from a SNOM probe tip

Takashi Fukuda, Kimio Sumaru, Yoshihito Narita, Tsutomu Inoue, Fuminori Sato, Hiro Matsuda

Proceedings Volume 4642, Organic Photonic Materials and Devices IV; (2002) https://doi.org/10.1117/12.470450
Event: Symposium on Integrated Optoelectronic Devices, 2002, San Jose, California, United States

Abstract

Regarding the characterization of the spatial distribution and the polarization condition of optical field emitted from a probe tip of scanning near-field optical microscope (SNOM), simple and effective evaluation technique is developed. It is realized in connection with the detailed knowledge of photo-induced surface relief formation phenomenon that occurs on the azobenzene functionalized polymer film. Since there was no easy method of evaluating a SNOM probe so far, this could be one of the promising techniques much more convenient than conventional methods. In this report, first the PSR phenomenon is explained and then several examples for the probe evaluation are demonstrated in far- and near-field condition. Furthermore, a trial for nano-patterning and ultra-high density rewritable data storage is performed via scanning near-field optical lithography.

Citation Download Citation

Takashi Fukuda, Kimio Sumaru, Yoshihito Narita, Tsutomu Inoue, Fuminori Sato, and Hiro Matsuda "Simple and effective technique for the evaluation of optical field emitted from a SNOM probe tip", Proc. SPIE 4642, Organic Photonic Materials and Devices IV, (13 June 2002); https://doi.org/10.1117/12.470450

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