Engineered defects for investigation of laser-induced damage of fused silica at 355 nm

Alex V. Hamza; Wigbert J. Siekhaus; Alexander M. Rubenchik; Michael D. Feit; Lloyd L. Chase; M. Savina; Michael J. Pellin; Ian D. Hutcheon; Mike C. Nostrand; Michael J. Runkel; Bill W. Choi; Michael C Staggs; Michael J. Fluss

doi:10.1117/12.461716

9 April 2002 Engineered defects for investigation of laser-induced damage of fused silica at 355 nm

Alex V. Hamza, Wigbert J. Siekhaus, Alexander M. Rubenchik, Michael D. Feit, Lloyd L. Chase, M. Savina, Michael J. Pellin, Ian D. Hutcheon, Mike C. Nostrand, Michael J. Runkel, Bill W. Choi, Michael C Staggs, Michael J. Fluss

Author Affiliations +

Proceedings Volume 4679, Laser-Induced Damage in Optical Materials: 2001; (2002) https://doi.org/10.1117/12.461716
Event: Boulder Damage, 2001, Boulder, CO, United States

Abstract

Embedded gold and mechanical deformation in silica were used to investigate initiation of laser-induced damage at 355 nm (7.6 ns). The nanoparticle-covered surfaces were coated with between 0 and 500 nm of SiO₂ by e-beam deposition. The threshold for observable damage and initiation site morphology for these engineered surfaces was determined. The gold nanoparticle coated surfaces with 500 nm SiO₂ coating exhibited pinpoint damage threshold of <0.7 J/cm² determined by light scattering and Nomarski microscopy. The gold nanoparticle coated surfaces with the 100 nm SiO₂ coatings exhibited what nominally appeared to be film exfoliation damage threshold of 19 J/cm² via light scattering and Nomarski microscopy. With atomic force microscopy pinholes could be detected at fluences greater than 7 J/cm² and blisters at fluences greater than 3 J/cm² on the 100-nm-coated surfaces. A series of mechanical indents and scratches were made in the fused silica substrates using a non-indentor. Plastic deformation without cracking led to damage thresholds of approximately 25 J/cm², whereas indents and scratches with cracking led to damage thresholds of only approximately 5 J/cm². Particularly illuminating was the deterministic damage of scratches at the deepest end of the scratch, as if the scratch acted as a waveguide.

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Alex V. Hamza, Wigbert J. Siekhaus, Alexander M. Rubenchik, Michael D. Feit, Lloyd L. Chase, M. Savina, Michael J. Pellin, Ian D. Hutcheon, Mike C. Nostrand, Michael J. Runkel, Bill W. Choi, Michael C Staggs, and Michael J. Fluss "Engineered defects for investigation of laser-induced damage of fused silica at 355 nm", Proc. SPIE 4679, Laser-Induced Damage in Optical Materials: 2001, (9 April 2002); https://doi.org/10.1117/12.461716

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