Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351 nm

Stavros G. Demos; Mike C. Nostrand; Michael C Staggs; Christopher W. Carr; Douglas E. Hahn; Mark R. Kozlowski; Lynn Matthew Sheehan; Colin L. Battersby; Alan K. Burnham

doi:10.1117/12.461715

9 April 2002 Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351 nm

Stavros G. Demos, Mike C. Nostrand, Michael C Staggs, Christopher W. Carr, Douglas E. Hahn, Mark R. Kozlowski, Lynn Matthew Sheehan, Colin L. Battersby, Alan K. Burnham

Author Affiliations +

Proceedings Volume 4679, Laser-Induced Damage in Optical Materials: 2001; (2002) https://doi.org/10.1117/12.461715
Event: Boulder Damage, 2001, Boulder, CO, United States

Abstract

This work is an experimental investigation to evaluate the potential of fluorescence microscopy as a tool to detect surface contamination as well as reveal surface damage precursors on DKDP and SiO₂ optics. To achieve these technical objectives, microscopic imaging systems were built that also incorporate in-situ damage testing capabilities. Fluorescence imaging experiments were performed using 351-nm laser excitation while damage testing was performed at relatively high laser fluences. The experimental results demonstrated the potential of this technique to address the aforementioned technical issues.

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Stavros G. Demos, Mike C. Nostrand, Michael C Staggs, Christopher W. Carr, Douglas E. Hahn, Mark R. Kozlowski, Lynn Matthew Sheehan, Colin L. Battersby, and Alan K. Burnham "Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351 nm", Proc. SPIE 4679, Laser-Induced Damage in Optical Materials: 2001, (9 April 2002); https://doi.org/10.1117/12.461715

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