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3 May 2002 Analysis of factors affecting the light collection efficiency in CT detector: CWO+PIN diode
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The solid-state detector(SSD) for X-CT consists of photodiode coupled to CdWO4$(CWO. It is important to maximize the light collection in respect of a patient's dose, radiation effect and X-ray efficiency. The factors affecting the light collection efficiency are analyzed and optimized by using experimental data and appropriate simulation code. Quantum nomogram is used to investigate the signal propagation characteristics of optimally designed solid-state detector and to ensure at which stage quantum sink occurs. This paper shows that the part of SSD, the CWO of treatment with ground top/ground side yields higher quanta than that of ground top/polish side, which is different from the result of previous studies. We also shows that optimum thickness of SiN passivation and p-layer is 0.12mm and 0.1mm, respectively. From the quantum nomogram calculated for optimal design, it is predicted that the most serious signal degradation occurs at the photodiode.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sung Woo Kwak, Kwang Hyun Kim, Ho Kyung Kim, Gyuseong Cho, Seong Kyu Ahn, Sung Min Goh, Yoon Lee, and Jung Byung Park "Analysis of factors affecting the light collection efficiency in CT detector: CWO+PIN diode", Proc. SPIE 4682, Medical Imaging 2002: Physics of Medical Imaging, (3 May 2002);


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