Diffraction-enhanced imaging utilizing different crystal reflections at Elettra and NSLS

Luigi Rigon; Zhong Zhong; Fulvia Arfelli; Ralf-Hendrik Menk; Alessandra Pillon

doi:10.1117/12.465567

3 May 2002 Diffraction-enhanced imaging utilizing different crystal reflections at Elettra and NSLS

Luigi Rigon, Zhong Zhong, Fulvia Arfelli, Ralf-Hendrik Menk, Alessandra Pillon

Proceedings Volume 4682, Medical Imaging 2002: Physics of Medical Imaging; (2002) https://doi.org/10.1117/12.465567
Event: Medical Imaging 2002, 2002, San Diego, California, United States

Abstract

Diffraction Enhanced Imaging (DEI) is a powerful X-ray imaging technique that allows the visualization of structures having different refraction and/or absorption properties with respect to the background. In DEI, the sample is irradiated with a monochromatic and highly collimated X-ray beam, and the outgoing beam is analyzed by means of a perfect crystal. A comparison was drawn among DEI images of a standard (ACR) and a custom phantom using different harmonic diffraction orders. Images were obtained at two different synchrotron beamlines, the SYRMEP beamline at Elettra and the X15A beamline at the NSLS (Brookhaven, NY), utilizing a double-crystal Si monochromator and a single-crystal Si analyzer, operated in the symmetric, non-dispersive Bragg configuration. The harmonic order was separated by placing a refractive prism between the two crystals of the monochromator. The use of the and the reflections resulted in a 5-fold improvement in the analyzer angular sensitivity, consequently enhancing the extinction and refraction contrasts with respect to the reflection. The detail visibility was improved by 1-2 orders of magnitude. By means of the refractive prism technique, even higher harmonics might be used, thus promising even better image quality.

Citation Download Citation

Luigi Rigon, Zhong Zhong, Fulvia Arfelli, Ralf-Hendrik Menk, and Alessandra Pillon "Diffraction-enhanced imaging utilizing different crystal reflections at Elettra and NSLS", Proc. SPIE 4682, Medical Imaging 2002: Physics of Medical Imaging, (3 May 2002); https://doi.org/10.1117/12.465567

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