Paper
10 July 2002 Preisach model for quantifying hysteresis in an atomic force microscope
Ralph C. Smith, Murti V. Salapaka, Luke Cherveny
Author Affiliations +
Abstract
Atomic force microscopes employ stacked or cylindrical piezoceramic actuators to achieve sub-angstrom resolution. While these devices produce excellent set-point accuracy, they exhibit hysteresis and constitutive nonlinearities even at low drive levels. Feedback mechanisms can mitigate the deleterious effects of these nonlinearities for low frequency operation but such techniques fail at higher frequencies due to increased noise to signal ratios. In this paper, we quantify the hysteresis and constitutive nonlinearities through a Preisach model. As illustrated through a comparison with experimental data, this provides a characterization which is sufficiently accurate for inclusion as an inverse compensator in various control designs.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ralph C. Smith, Murti V. Salapaka, and Luke Cherveny "Preisach model for quantifying hysteresis in an atomic force microscope", Proc. SPIE 4693, Smart Structures and Materials 2002: Modeling, Signal Processing, and Control, (10 July 2002); https://doi.org/10.1117/12.475245
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Cited by 3 scholarly publications.
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KEYWORDS
Actuators

Data modeling

Atomic force microscope

Atomic force microscopy

Mathematical modeling

Polarization

Signal to noise ratio

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