In-situ sensors for product reliability monitoring

Satchidananda Mishra; Michael Pecht; Douglas L. Goodman

doi:10.1117/12.462807

19 April 2002 In-situ sensors for product reliability monitoring

Satchidananda Mishra, Michael Pecht, Douglas L. Goodman

Proceedings Volume 4755, Design, Test, Integration, and Packaging of MEMS/MOEMS 2002; (2002) https://doi.org/10.1117/12.462807
Event: Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS 2002, 2002, Cannes-Mandelieu, France

Abstract

Some advantages of predicting reliability include providing advance warning signs of failure, and the reduction of life cycle costs by reducing inspection and unscheduled maintenance. However, predictions can be inaccurate if they do not account for the actual environments that the product is subjected to in its li8fe cycle. This paper describes an in-situ sensor (prognostic monitor) approach, which can be used to estimate the accumulated damage and the remaining life of semiconductor devices.

Citation Download Citation

Satchidananda Mishra, Michael Pecht, and Douglas L. Goodman "In-situ sensors for product reliability monitoring", Proc. SPIE 4755, Design, Test, Integration, and Packaging of MEMS/MOEMS 2002, (19 April 2002); https://doi.org/10.1117/12.462807

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