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9 August 2002 Determination of optical properties of PLZT thin films using transmittance spectra processing
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Proceedings Volume 4762, ALT'01 International Conference on Advanced Laser Technologies; (2002) https://doi.org/10.1117/12.478633
Event: International Conference on: Advanced Laser Technologies (ALT'01), 2001, Constanta, Romania
Abstract
This investigation deals with determination of optical parameters of thin PLZT films prepared by pulsed laser deposition on fused silica substrates at different oxygen pressure. Film composition and structure are investigated by WDX and XRD. Defects concentration in the films is studied using triboluminescence. Changes of film refractive index n((lambda) ), extinction k((lambda) ) with wavelength in the spectral region 0.3 - 1.1 micrometers and film thickness d are determined as a result of transmittance spectra processing. Waveguiding properties of the films are investigated.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tamara G. Pencheva, Milen Nenkov, Miroslav Jelinek, Jan Lancok, Jiri Bulir, Alexandr Deineka, and Chao-Nan Xu "Determination of optical properties of PLZT thin films using transmittance spectra processing", Proc. SPIE 4762, ALT'01 International Conference on Advanced Laser Technologies, (9 August 2002); https://doi.org/10.1117/12.478633
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