Development of a two-dimensional focusing faceted x-ray analyzer

Harald Sinn; Nicolai A. Moldovan; Ayman H. Said; Ercan E. Alp

doi:10.1117/12.451185

21 November 2002 Development of a two-dimensional focusing faceted x-ray analyzer

Harald Sinn, Nicolai A. Moldovan, Ayman H. Said, Ercan E. Alp

Proceedings Volume 4783, Design and Microfabrication of Novel X-Ray Optics; (2002) https://doi.org/10.1117/12.451185
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

We present a new concept for an X-ray analyzer for meV-spectroscopy with hard X-rays in the range of 20 keV. The analyzer consists of a 5"-diameter planar glass disk with about 8000 silicon crystal pixels glued to it. With a spherical bender it is bent to a radius of 6 m. The slope error over a 4"-diameter area is about 0.8 μm RMS. Used in a spectrometer for inelastic X-ray scattering as an analyzer, an overall energy resolution of 1.0 meV at 25.7 keV and of 1.8 meV at 21.6 keV is obtained.

Citation Download Citation

Harald Sinn, Nicolai A. Moldovan, Ayman H. Said, and Ercan E. Alp "Development of a two-dimensional focusing faceted x-ray analyzer", Proc. SPIE 4783, Design and Microfabrication of Novel X-Ray Optics, (21 November 2002); https://doi.org/10.1117/12.451185

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