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21 November 2002 Refractive x-ray optics: step from focusing to interferometric devices
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Abstract
X-ray refractive optics is mainly concerned on a focusing devices. Another kinds of X-ray refractive devices with a new functionality, namely X-ray biprism and Michelsone echelon are considered. An experiment was fulfilled with biprism made from the synthetic diamond crystals on BM05 beamline ESRF. A computer simulation technique was developed to obtain interference patterns generated by the biprism with an account of a variety of experiment geometrical conditions, source size and absorption in biprism material. Recorded interference patterns were in a good agreement with the predicted ones for a given experimental conditions. Thus a complete description of a brightness distribution in source can be obtained by a reconstruction of the intensity distributions in interference fringes using the developed technique for investigation of synchrotron beams coherence. Possibilities of devices realisation with a extended functional capabilities by means of previously used microelectronic planar techniques are discussed.
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Leonid Shabel'nikov, Igor A. Schelokov, Anatoly A. Snigirev, Irina Snigireva, and Serguei Kuznetsov "Refractive x-ray optics: step from focusing to interferometric devices", Proc. SPIE 4783, Design and Microfabrication of Novel X-Ray Optics, (21 November 2002); https://doi.org/10.1117/12.447862
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