Biased percolation approach to failure propagation in nanostructures and prediction of the total failure by electronic noise analysis

Laszlo B. Kish; Cecilia Penetta; Zoltan Gingl

doi:10.1117/12.457548

4 November 2002 Biased percolation approach to failure propagation in nanostructures and prediction of the total failure by electronic noise analysis

Laszlo B. Kish, Cecilia Penetta, Zoltan Gingl

Author Affiliations +

Proceedings Volume 4809, Nanoscale Optics and Applications; (2002) https://doi.org/10.1117/12.457548
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

The analysis of electronic noise has the potential to predict forthcoming catastrophic failure of electronic devices and integrated circuits. This has a particularly important potential in submicron and nanoelectronics.

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Laszlo B. Kish, Cecilia Penetta, and Zoltan Gingl "Biased percolation approach to failure propagation in nanostructures and prediction of the total failure by electronic noise analysis", Proc. SPIE 4809, Nanoscale Optics and Applications, (4 November 2002); https://doi.org/10.1117/12.457548

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