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1 November 2002 Chemical imaging of structured SAMs with a novel SFG microscope
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Abstract
We present a newly developed microscope for sum frequency generation (SFG) imaging of opaque and reflecting interfaces. The sample is viewed at an angle of 60° with respect to the surface normal in order to increase the collected SFG intensity. Our setup is designed to keep the whole field of view (FOV) in focus and to compensate for the distortion usually related to oblique imaging by means of a blazed grating. The separation of the SFG intensity and the reflected visible beam is accomplished by a suitable combination of spectral filters. The sum frequency microscope (SFM) is capable of in-situ chemically selective imaging by tuning the IR-beam to vibrational transitions of the respective molecules. The SFM is applied to imaging of structured self-assembled monolayers (SAM) of thiol molecules on a gold surface.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dominik M. P. Hoffmann, Klaus Kuhnke, and Klaus Kern "Chemical imaging of structured SAMs with a novel SFG microscope", Proc. SPIE 4812, Nonlinear Spectroscopy, (1 November 2002); https://doi.org/10.1117/12.451380
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