Spectral responsivity measurement of uncooled IRFPA using a free-electron laser

Tomohiro Ishikawa; Masashi Ueno; Masafumi Kimata; Toshiki Seto; Natsuro Tsubouchi

doi:10.1117/12.500926

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23 January 2003 Spectral responsivity measurement of uncooled IRFPA using free electron laser

Tomohiro Ishikawa, Masashi Ueno, Masafumi Kimata, Toshiki Seto, Natsuro Tsubouchi

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Proceedings Volume 4820, Infrared Technology and Applications XXVIII; (2003) https://doi.org/10.1117/12.500926
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

Spectral responsivity of an uncooled IRFPA with SOI diode detectors has been measured using a free electron laser (FEL), which is a new optical source with tunable wavelegnth. Light from the FEL has a complicated pulse structure, and the beam has spatial non-uniformity. These features make it difficult to evaluate the responsivity of the thermal detector with the FEL. To measure the responsivity, images of the FEL beam are recorded and analyzed by an image processor. The spectral resonsivity obtained is flat in the wavelength from 5μm to 16.5μm, and the effect of the optical resonant is smaller than that of a two-level microbolometer.

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Tomohiro Ishikawa, Masashi Ueno, Masafumi Kimata, Toshiki Seto, and Natsuro Tsubouchi "Spectral responsivity measurement of uncooled IRFPA using free electron laser", Proc. SPIE 4820, Infrared Technology and Applications XXVIII, (23 January 2003); https://doi.org/10.1117/12.500926

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