Measurement of the o-ray and e-ray infrared refractive index and absorption coefficients of sapphire from 10 K to 295 K

Simon G. Kaplan; Michael E. Thomas

doi:10.1117/12.451770

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25 November 2002 Measurement of the o-ray and e-ray infrared refractive index and absorption coefficients of sapphire from 10K to 295K

Simon G. Kaplan, Michael E. Thomas

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Proceedings Volume 4822, Cryogenic Optical Systems and Instruments IX; (2002) https://doi.org/10.1117/12.451770
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm^-1 to 10000 cm^-1 wavenumber range and temperatures from 10 K to 295 K. The refractive index is determined by a combination of room-temperature minimum-deviation prism measurements at 2950 cm^-1 and temperature-dependent high-resolution transmission measurements of a 1 mm thick etalon sample from the same batch of material. A Brewster-angle polarizer with an extinction ratio of <10^-5 is used for polarization selection. The uncertainties in the fringe-counting method are analyzed. The temperature dependence of the absorption coefficient is compared with the predictions of a multi-phonon model for sapphire.

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Simon G. Kaplan and Michael E. Thomas "Measurement of the o-ray and e-ray infrared refractive index and absorption coefficients of sapphire from 10K to 295K", Proc. SPIE 4822, Cryogenic Optical Systems and Instruments IX, (25 November 2002); https://doi.org/10.1117/12.451770

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