Direct near-surface measurement of refractive index: extension of the Brewster-Pfund method to graded-index films

Marcelo Barbalho Pereira; Flavio Horowitz

doi:10.1117/12.524576

19 November 2003 Direct near-surface measurement of refractive index: extension of the Brewster-Pfund method to graded-index films

Marcelo Barbalho Pereira, Flavio Horowitz

Author Affiliations +

Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.524576
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy

Abstract

As a complement to the standard m-line method, where an analytical curve is fitted to the measurements of waveguide modes and extrapolated to provide the refractive index in the zero-depth limit, we review our polarimetric approach to a direct-near surface measurement of graded-index films, and present its new and more straightforward version, which is applicable to existing samples without masking procedures prior to ion exchange.

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Marcelo Barbalho Pereira and Flavio Horowitz "Direct near-surface measurement of refractive index: extension of the Brewster-Pfund method to graded-index films", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.524576

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