Paper
19 February 2003 Enhancement of debris attachment and atomic redistribution of femtosecond laser ablation using phase-shifted Gaussian beams
Hiroki Murata, Masanori Miyazawa, Koichi Toyoda
Author Affiliations +
Proceedings Volume 4830, Third International Symposium on Laser Precision Microfabrication; (2003) https://doi.org/10.1117/12.486520
Event: LAMP 2002: International Congress on Laser Advanced Materials Processing, 2002, Osaka, Japan
Abstract
Femtosecond laser ablation using phase-shifted laser beam is reported. Phase-shifting method is a unique method to modify the Gaussian intensity profile into closely adjacent pair of the high intensity peaks. The phase-shifting was accomplished by the use of reflecting plane-mirror whose plane has a step of quarter of the wavelength. The calculation of intensity profiles using Fresnel diffraction theory shows a steep intensity changes in a very closed area. In the experiment of femtosecond laser ablation using phase-shifted beams, debris attachment has been observed both surround area and the central part corresponding to the phase edge. We discuss the anomalous enhancement of debris attachment at the central part.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiroki Murata, Masanori Miyazawa, and Koichi Toyoda "Enhancement of debris attachment and atomic redistribution of femtosecond laser ablation using phase-shifted Gaussian beams", Proc. SPIE 4830, Third International Symposium on Laser Precision Microfabrication, (19 February 2003); https://doi.org/10.1117/12.486520
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KEYWORDS
Phase shifts

Laser ablation

Copper

Zinc

Gaussian beams

Scanning electron microscopy

Nickel

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