Paper
19 February 2003 How to sensitively measure the rate of neutral free radical production by photo-deionization of negative ion beams
Keiji Hayashi, Hiroshi Konno, Hideki Kojima, Makoto Minato, Takashi Oseki, Yasunori Kawamura, Kenji Kameko, Takuo Kanayama
Author Affiliations +
Proceedings Volume 4830, Third International Symposium on Laser Precision Microfabrication; (2003) https://doi.org/10.1117/12.486564
Event: LAMP 2002: International Congress on Laser Advanced Materials Processing, 2002, Osaka, Japan
Abstract
Two measurement methods to determine the rate of neutral free radical production by the photo-deionization of negative ion beams ( PDINIB ) are introduced. These methods, namely, photoelectron-current measurement by low-frequency electro-modulation probe ( PMMP ) and measurement of decrease in the negative-ion beam current ( DNIC ) were employed to evaluate the production rate in a trail surface-processing apparatus developed in the author’s laboratory utilizing a steady-flux refined beam of neutral free radicals produced by the PDINIB procedure. A 63Cu- negative ion beam of kinetic energy Ei varied up to 15 keV was irradiated with a 514.5 nm visible light beam from a 25 W CW Ar+ ion laser. The detection limit of the production rate by the PMMP setup was as high as 6×109/s under the condition that Ei = 15keV, the negative ion beam current Ii = 4 μA, and the laser power P = 6W. The DNIC method is simpler but less reliable than the PMMP method owing to larger uncertainty resulting from the fluctuation of the negative-ion beam current.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Keiji Hayashi, Hiroshi Konno, Hideki Kojima, Makoto Minato, Takashi Oseki, Yasunori Kawamura, Kenji Kameko, and Takuo Kanayama "How to sensitively measure the rate of neutral free radical production by photo-deionization of negative ion beams", Proc. SPIE 4830, Third International Symposium on Laser Precision Microfabrication, (19 February 2003); https://doi.org/10.1117/12.486564
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KEYWORDS
Ion beams

Ions

Electrons

Continuous wave operation

Ion lasers

Particles

Visible radiation

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