Paper
23 December 2002 High NA projection lens design for exposure tools
Toshiro Ishiyama, Kotaro Yamaguchi
Author Affiliations +
Proceedings Volume 4832, International Optical Design Conference 2002; (2002) https://doi.org/10.1117/12.486475
Event: International Optical Design Conference 2002, 2002, Tucson, AZ, United States
Abstract
In the history of the semiconductor industry, exposure tools have been improved in resolution. This paper describes how to increase NA of projection lens up to more than 0.7 without increasing lens diameter or deteriorating the aberrations.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Toshiro Ishiyama and Kotaro Yamaguchi "High NA projection lens design for exposure tools", Proc. SPIE 4832, International Optical Design Conference 2002, (23 December 2002); https://doi.org/10.1117/12.486475
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Monochromatic aberrations

Lens design

Spherical lenses

Scanners

Wavefront aberrations

Diffractive optical elements

Geometrical optics

RELATED CONTENT

Criteria of limit of applying DOE to precise optics
Proceedings of SPIE (February 22 2018)
Optical Systems With Off-Axis Mirrors
Proceedings of SPIE (June 10 1987)
The Use Of The Pseudo Eikonal In The Optimization Of...
Proceedings of SPIE (April 13 1989)
Exact sine condition in the presence of spherical aberration
Proceedings of SPIE (January 01 1991)
Aberration Characteristics Of Optical Elements
Proceedings of SPIE (April 12 1990)
Aplanatic holographic systems
Proceedings of SPIE (October 01 1991)

Back to Top