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17 February 2003 Holographic characterization of fulgides doped polymer films
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Proceedings Volume 4833, Applications of Photonic Technology 5; (2003) https://doi.org/10.1117/12.474839
Event: Applications of Photonic Technology 5, 2002, Quebec City, Canada
Abstract
Dynamic holographic recording was performed on two fulgides (A540 and A670)/Doped films. Maximum diffraction efficiency of 7% and 6% has been achieved on A540 and A670 doped PEPC/PS films. The effects of the matrix, writing intensity and film thickness on diffraction efficiency were studied. Holographic fatigue resistance in polymer matrix and epoxy resin has been investigated. It was found that holographic fatigue of fulgide doped in epoxy resin is closed to zero at least after 40 Write-Read-Erase cycles (WRE).
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christophe Lafond, Michel Bolte, and Roger A. Lessard "Holographic characterization of fulgides doped polymer films", Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); https://doi.org/10.1117/12.474839
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