Refractive index measurements of planar chalcogenide waveguide

Jacques M Laniel; Jean-Michel Menard; Alain Villeneuve; Real Vallee; Cedric Lopez; Kathleen A. Richardson

doi:10.1117/12.474311

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17 February 2003 Refractive index measurements of planar chalcogenide waveguide

Jacques M Laniel, Jean-Michel Menard, Alain Villeneuve, Real Vallee, Cedric Lopez, Kathleen A. Richardson

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Proceedings Volume 4833, Applications of Photonic Technology 5; (2003) https://doi.org/10.1117/12.474311
Event: Applications of Photonic Technology 5, 2002, Quebec City, Canada

Abstract

We report results from a systematic study of the linear refractive index of thin films made of As-S-Se glasses which are part of the chalcogenide family. We have studied eight different compositions. The refractive index are measured by the mean of a grating coupling experiment. The measurements are performed around 1.5μm for both annealed and non-annealed glasses. We observe that annealing the samples increases their refractive index. We also note that the increase of Selenium concentration increases the refractive index and the decrease of Arsenic concentration decreases the refractive index.

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Jacques M Laniel, Jean-Michel Menard, Alain Villeneuve, Real Vallee, Cedric Lopez, and Kathleen A. Richardson "Refractive index measurements of planar chalcogenide waveguide", Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); https://doi.org/10.1117/12.474311

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