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17 February 2003Surface texture characterization using a chroma meter
This paper discusses surface texture characterization of silicon, silicon carbide and some metal surfaces using a Chroma Meter. The specimen surfaces were obtained with various machining methods. Lightness (brightness) has a good correlation with surface roughness and could be used as an in-process/in-cycle/post-process technique for surface texture characterization. Surfaces with lower roughness values had lower lightness values.
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Zhaowei Zhong, "Surface texture characterization using a chroma meter," Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); https://doi.org/10.1117/12.474041