Toward nanometer accuracy laser metrology for phase-referenced interferometry with the VLTI

Samuel A. Leveque; Rainer Wilhelm; Yves Salvade; Olivier Scherler; Rene Daendliker

doi:10.1117/12.457173

21 February 2003 Toward nanometer accuracy laser metrology for phase-referenced interferometry with the VLTI

Samuel A. Leveque, Rainer Wilhelm, Yves Salvade, Olivier Scherler, Rene Daendliker

Proceedings Volume 4838, Interferometry for Optical Astronomy II; (2003) https://doi.org/10.1117/12.457173
Event: Astronomical Telescopes and Instrumentation, 2002, Waikoloa, Hawai'i, United States

Abstract

The PRIMA laser metrology system is being developed to monitor optical path differences and optical path fluctuations encountered by two stellar objects inside the VLTI during phased-referenced observations. This system, which will operate at the scale of the VLTI, has an accuracy goal of a few nanometers. After an introduction to its design, based on heterodyne interferometry, this paper presents the results of sub-system characterization and prototyping as well as experimental results obtained during full-scale testing at the Paranal Observatory.

Citation Download Citation

Samuel A. Leveque, Rainer Wilhelm, Yves Salvade, Olivier Scherler, and Rene Daendliker "Toward nanometer accuracy laser metrology for phase-referenced interferometry with the VLTI", Proc. SPIE 4838, Interferometry for Optical Astronomy II, (21 February 2003); https://doi.org/10.1117/12.457173

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