Ritchey-Common test used for measurement of astronomical optic

Sen Han; Erik Novak; Mike Schurig

doi:10.1117/12.457001

30 January 2003 Ritchey-common test used for measurement of astronomical optic

Sen Han, Erik Novak, Mike Schurig

Proceedings Volume 4842, Specialized Optical Developments in Astronomy; (2003) https://doi.org/10.1117/12.457001
Event: Astronomical Telescopes and Instrumentation, 2002, Waikoloa, Hawai'i, United States

Abstract

The Ritchey-Common test is a well-known method for large flat measurements. This paper describes a straightforward implementation of the formulas, to allow accurate surface height calculation using relatively few separate measurements. Both Ritchey-Common test and direct measurement results are presented. In comparison of the two methods, the Ritchey-Common test is in good agreement with the direct measurement.

Citation Download Citation

Sen Han, Erik Novak, and Mike Schurig "Ritchey-common test used for measurement of astronomical optic", Proc. SPIE 4842, Specialized Optical Developments in Astronomy, (30 January 2003); https://doi.org/10.1117/12.457001

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