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11 March 2003 New calibration method for x-ray detection efficiency without using reference counters
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We propose a new method for absolute calibration of detection efficiency of X-ray detector. The method utilizes measurements with different X-ray incident angles. We first introduce the idea of the method, slant incidence method, in a simplified example. Secondly, we apply the method to measure a filter thickness, using the X-ray CCD camera and a 55Fe isotope source in order to verify our idea. The slant incidence method functions as we expected, but contradiction as large as 30% is observed against the estimates by conventional on-off method. Finally, we apply the slant incidence method to measure the build-in dead layer thickness of an X-ray CCD. using the X-ray spectrometer as a source. We got reasonable estimates for the thickness of the dead layer. An X-ray spectrometer is used to get the ratio of detected intensity of 45"a incidence to that of 0"a incidence as a function of X-ray energy. We get reasonable estimates for the thicknesses of two kinds of dead layers, SiO2 and Si. Discussion on advantages and limitations of this method, and future prospect is mentioned shortly.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kiyoshi Hayashida, Takayuki Shiroshoji, Koichi Fukuda, and Haruyoshi Katayama "New calibration method for x-ray detection efficiency without using reference counters", Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, (11 March 2003);


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