W/SiC x-ray multilayers optimized for use above 100 keV

David L. Windt; Soizik Donguy; Charles J. Hailey; Jason Koglin; Veijo Honkimaki; Eric Ziegler; Finn Erland Christensen; C. M. Hubert Chen; Fiona A. Harrison; William W. Craig

doi:10.1117/12.461303

11 March 2003 W/SiC X-ray multilayers optimized for use above 100 keV

David L. Windt, Soizik Donguy, Charles J. Hailey, Jason Koglin, Veijo Honkimaki, Eric Ziegler, Finn Erland Christensen, C. M. Hubert Chen, Fiona A. Harrison, William W. Craig

Author Affiliations +

Proceedings Volume 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy; (2003) https://doi.org/10.1117/12.461303
Event: Astronomical Telescopes and Instrumentation, 2002, Waikoloa, Hawai'i, United States

Abstract

We have developed a new depth-graded multilayer system comprising W and SiC layers, suitable for use as hard X-ray reflective coatings operating in the energy range 100 - 200 keV. Grazing incidence X-ray reflectance at E=8 keV was used to characterize the interface widths, as well as the temporal and thermal stability in both periodic and depth-graded W/SiC structures, while synchrotron radiation was used to measure the hard X-ray reflectance of a depth-graded multilayer designed specifically for use in the range E~150 - 170 keV. We have modeled the hard X-ray reflectance using newly-derived optical constants, which we determined from reflectance-vs-incidence angle measurements also made using synchrotron radiation, in the range E=120 - 180 keV. We describe our experimental investigation in detail, compare the new W/SiC multilayers with both W/Si and W/B₄C films that have been studied previously, and discuss the significance of these results with regard to the eventual development of a hard X-ray nuclear line telescope.

Citation Download Citation

David L. Windt, Soizik Donguy, Charles J. Hailey, Jason Koglin, Veijo Honkimaki, Eric Ziegler, Finn Erland Christensen, C. M. Hubert Chen, Fiona A. Harrison, and William W. Craig "W/SiC X-ray multilayers optimized for use above 100 keV", Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, (11 March 2003); https://doi.org/10.1117/12.461303

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available