Wide-field imaging interferometry testbed 3: metrology subsystem

Douglas B. Leviton; Brad J. Frey; David T. Leisawitz; Anthony J. Martino; William L. Maynard; Lee G. Mundy; Stephen A. Rinehart; Stacy H. Teng; Xiaolei Zhang

doi:10.1117/12.460948

26 February 2003 Wide-field imaging interferometry testbed 3: metrology subsystem

Douglas B. Leviton, Brad J. Frey, David T. Leisawitz, Anthony J. Martino, William L. Maynard, Lee G. Mundy, Stephen A. Rinehart, Stacy H. Teng, Xiaolei Zhang

Author Affiliations +

Proceedings Volume 4852, Interferometry in Space; (2003) https://doi.org/10.1117/12.460948
Event: Astronomical Telescopes and Instrumentation, 2002, Waikoloa, Hawai'i, United States

Abstract

In order for data products from WIIT to be as robust as possible, the alignment and mechanical positions of source, receiver, and detector components must be controlled and measured with extreme precision and accuracy, and the ambient environment must be monitored to allow environmental effects to be correlated with even small perturbations to fringe data. Relevant detailed anatomy of many testbed components and assemblies are described. The system of displacement measuring interferometers (DMI), optical encoders, optical alignment tools, optical power monitors, and temperature sensors implemented for control and monitoring of the testbed is presented.

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Douglas B. Leviton, Brad J. Frey, David T. Leisawitz, Anthony J. Martino, William L. Maynard, Lee G. Mundy, Stephen A. Rinehart, Stacy H. Teng, and Xiaolei Zhang "Wide-field imaging interferometry testbed 3: metrology subsystem", Proc. SPIE 4852, Interferometry in Space, (26 February 2003); https://doi.org/10.1117/12.460948

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