Paper
11 February 2003 Multiple Etalon Systems for the Advanced Technology Solar Telescope
G. Allen Gary, K. S. Balasubramaniam, Michael Sigwarth
Author Affiliations +
Abstract
Multiple etalon systems are discussed that meet the science requirements for a narrow-passband imaging system for the 4-meter National Solar Observatory (NSO)/Advance Technology Solar Telescope (ATST). A multiple etalon system can provide an imaging interferometer that works in four distinct modes: as a spectro-polarimeter, a filter-vector magnetograph, an intermediate-band imager, and broadband high-resolution imager. Specific dual and triple etalon configurations are described that provide a spectrographic passband of 2.0-3.5 pm and reduce parasitic light levels to 10-4 as required for precise polarization measurement, e.g., Zeeman measurements of magnetic sensitive lines. A TESOS-like (Telecentric Etalon SOlar Spectrometer) triple etalon system provides a spectral purity of 10-5. The triple designs have the advantage of reducing the finesse requirement on each etalon; allow the use of more stable blocking filters, and have very high spectral purity. A dual-etalon double-pass (Cavallini-like) system can provide a competing configuration. Such a dual-etalon design can provide high contrast. The selection of the final focal plane instrument will depend on a trade-off between an ideal instrument and practical reality. The trade study will include the number of etalons, their aperture sizes, complexities of the optical train, number of blocking filters, configuration of the electronic control system, computer interfaces, temperature controllers, etalon controllers, and their associated feedback electronics. The heritage of single and multiple etalon systems comes from their use in several observatories, including the Marshall Space Flight Center (MSFC) Solar Observatory, Sacramento Peak Observatory (NSO), and Kiepenheuer-Institut für Sonnenphysik (KIS, Germany), Mees Solar Observatory (University of Hawaii), and Arcetri Astrophysical Observatory (Italy). The design of the ATST multiple etalon system will benefit from the experience gained at these observatories.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Allen Gary, K. S. Balasubramaniam, and Michael Sigwarth "Multiple Etalon Systems for the Advanced Technology Solar Telescope", Proc. SPIE 4853, Innovative Telescopes and Instrumentation for Solar Astrophysics, (11 February 2003); https://doi.org/10.1117/12.460272
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Cited by 10 scholarly publications.
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KEYWORDS
Fabry–Perot interferometers

Optical filters

Imaging systems

Reflectivity

Spectral resolution

Observatories

Collimation

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