Modulation spectral method to measure amplitude-phase characteristics of optical signals and transfer functions varying in time

V. A. Zubov

doi:10.1117/12.484569

29 July 2002 Modulation spectral method to measure amplitude-phase characteristics of optical signals and transfer functions varying in time

V. A. Zubov

Author Affiliations +

Proceedings Volume 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life; (2002) https://doi.org/10.1117/12.484569
Event: Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, 2002, Novosibirsk, Russian Federation

Abstract

We consider the solution of the phase problem in optics as applied to signals varying in time, in particular, to ultra-short signals. In order to get information about changing the amplitude and phase of optical signal in time, the modulationspectral method is used. We register the intensity distributions directly for the signal spectrum, and for the spectrum of the signal additionally modulated. The modulation provides a visualization of the phase information. The intensity distributions obtained allow one to calculate the structure of the signal under consideration. We consider three variants of the signal analysis. The first one is immediate analysis of the signal whose characteristics vary in time. The second variant deals with varying in time optical characteristics of the object (medium) analyzed by means of probing with radiation of known structure and measuring the parameters of the radiation passed through the object (medium). The third variant consists in simultaneous determination and analysis of structures of the signal (varying in time) and of the transfer function which describes the influence ofthe medium, object or optical system on the propagating signal.

Citation Download Citation

V. A. Zubov "Modulation spectral method to measure amplitude-phase characteristics of optical signals and transfer functions varying in time", Proc. SPIE 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, (29 July 2002); https://doi.org/10.1117/12.484569

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