Translator Disclaimer
27 March 1985 Revealing Hidden Diffractors By Correlation Measurements
Author Affiliations +
Proceedings Volume 0492, 1984 European Conf on Optics, Optical Systems, and Applications; (1985)
Event: 1984 European Conference on Optics, Optical Systems and Applications, 1984, Amsterdam, Netherlands
New results are presented which confirm the feasibility of detecting hidden diffracting structures by measuring the correlation of the far-zone scattered field. In particular, diffraction gratings were masked by random phase diffusers bonded to their surfaces, which precluded exploiting the usual temporal fluctuations which arise whenever the diffractor and diffuser are in relative motion. Instead, it was necessary to scan the quasistationary, broadly distributed speckle patterns spatially. Good agreement between the propagation theory for first-order field statistics and the experimental results was obtained with regard to the dependence on the geometric scanning parameters. Moreover, the dependence of the measured correlations on grating period and diffuser correlation length showed satisfactory agreement with the theory and allowed inferences to be made about nature of the diffuser statistics.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. S. Glass, K. M. Jauch, E. R. Pike, and J. Rarity "Revealing Hidden Diffractors By Correlation Measurements", Proc. SPIE 0492, 1984 European Conf on Optics, Optical Systems, and Applications, (27 March 1985);


Speckle Statistics With A Small Number Of Scatterers
Proceedings of SPIE (December 03 1980)
A Random Walk through the Field of Speckle
Proceedings of SPIE (November 25 1985)
First and second order statistics of far zone dynamic...
Proceedings of SPIE (December 01 1997)

Back to Top