Application of micro-interferometrics in fiber end surface analysis

Zhaohui Li; Wencai Jing; Yimo Zhang; Ge Zhou; Hongxia Zhang; Haifeng Li; Xiaoming Man

doi:10.1117/12.481735

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5 September 2002 Application of micro-interferometrics in fiber end surface analysis

Zhaohui Li, Wencai Jing, Yimo Zhang, Ge Zhou, Hongxia Zhang, Haifeng Li, Xiaoming Man

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Proceedings Volume 4921, Optical Manufacturing Technologies; (2002) https://doi.org/10.1117/12.481735
Event: Photonics Asia, 2002, Shanghai, China

Abstract

A noncontact system for detecting and monitoring the grain and contour of optical connector end face based on Mirau-type interferometer is proposed in this paper. In this system, phase shift technique has been adopted. A five steps algorithm is presented. By this algorithm, the computer can analyze the interference pattern and unwrapped the phase information of the detected surface. Then we can get the differential height of every point on the surface. This method is capable of measuring fiber height to ±0.003 microns and radius of curvature and offset of polish to ±0.30 mm and ±2.0 microns respectively. So we can get not only 2-D and 3-D topography of testing surface, but also the evaluation parameters of surface roughness.

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Zhaohui Li, Wencai Jing, Yimo Zhang, Ge Zhou, Hongxia Zhang, Haifeng Li, and Xiaoming Man "Application of micro-interferometrics in fiber end surface analysis", Proc. SPIE 4921, Optical Manufacturing Technologies, (5 September 2002); https://doi.org/10.1117/12.481735

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