Nonlinear analysis on diffraction properties of volume hologram

Jing Zhou; Dahe Liu; Kun Ren

doi:10.1117/12.481491

30 August 2002 Nonlinear analysis on diffraction properties of volume hologram

Jing Zhou, Dahe Liu, Kun Ren

Proceedings Volume 4924, Holography, Diffractive Optics, and Applications; (2002) https://doi.org/10.1117/12.481491
Event: Photonics Asia, 2002, Shanghai, China

Abstract

The nonlinear refractive index model is used to analyze the diffraction properties of reflection volume hologram. Using characteristic matrix method of multi-layer system, we analyzed the wavelength selectivity and angular selectivity of the diffraction efficiency of reflection volume hologram for P and S polarization. Compared to the classic pure sinusoidal index modulation, this nonlinear model gave more practical results.

Citation Download Citation

Jing Zhou, Dahe Liu, and Kun Ren "Nonlinear analysis on diffraction properties of volume hologram", Proc. SPIE 4924, Holography, Diffractive Optics, and Applications, (30 August 2002); https://doi.org/10.1117/12.481491

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available