Multilayer multilevel storage testing system

Hui Zhao; Guosheng Qi; Duanyi Xu; Xuesong Mai; Lei Zhang

doi:10.1117/12.483359

17 September 2002 Multilayer multilevel storage testing system

Hui Zhao, Guosheng Qi, Duanyi Xu, Xuesong Mai, Lei Zhang

Proceedings Volume 4930, Advanced Optical Storage Technology; (2002) https://doi.org/10.1117/12.483359
Event: Photonics Asia, 2002, Shanghai, China

Abstract

A novel storage system is introduced which bases on the "multilayer multilevel storage model." Three kinds of lasers that are different in wavelength are used to record data or test some storage material in this system. An example that is testing the photochromic material is also introduced to explain the usage of the system in testing storage material.

Citation Download Citation

Hui Zhao, Guosheng Qi, Duanyi Xu, Xuesong Mai, and Lei Zhang "Multilayer multilevel storage testing system", Proc. SPIE 4930, Advanced Optical Storage Technology, (17 September 2002); https://doi.org/10.1117/12.483359

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