Luminescence of UV thin films

Joerg Heber; Christian Muehlig; Wolfgang Triebel; Norbert Danz; Roland Thielsch; Norbert Kaiser

doi:10.1117/12.472391

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30 May 2003 Luminescence of UV thin films

Joerg Heber, Christian Muehlig, Wolfgang Triebel, Norbert Danz, Roland Thielsch, Norbert Kaiser

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Proceedings Volume 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization; (2003) https://doi.org/10.1117/12.472391
Event: XXXIV Annual Symposium on Optical Materials for High Power Lasers: Boulder Damage Symposium, 2002, Boulder, CO, United States

Abstract

Luminescence measurements have been set up in order to study the interaction of UV-laser radiation with dielectric thin films. The pulsed laser excitation was carried out at 193-nm (6.4eV), the coating materials comprised wide-band-gap oxides and fluorides. Experiments show the significant optical response of single- and multilayer coatings on the low fluence excitation at sub-band-gap energy. Time- and spectrally-resolved measurements indicate characteristic emission bands of color centers in the deep-UV and vacuum-UV coating materials. An assignment of these optical transitions can be derived from the comparison with known bulk-material studies.

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Joerg Heber, Christian Muehlig, Wolfgang Triebel, Norbert Danz, Roland Thielsch, and Norbert Kaiser "Luminescence of UV thin films", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.472391

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