Measurement of the Wigner distribution of a helium neon laser with a spherical aberration and a tapered semiconductor laser using moving slit technology

Bert J. Neubert; Wolf-Dieter Scharfe; Guenter Huber

doi:10.1117/12.472046

30 May 2003 Measurement of the Wigner distribution of a helium neon laser with a spherical aberration and a tapered semiconductor laser using moving slit technology

Bert J. Neubert, Wolf-Dieter Scharfe, Guenter Huber

Author Affiliations +

Proceedings Volume 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization; (2003) https://doi.org/10.1117/12.472046
Event: XXXIV Annual Symposium on Optical Materials for High Power Lasers: Boulder Damage Symposium, 2002, Boulder, CO, United States

Abstract

We determine the Wigner distribution of a laser experimentally from intensity profiles obtained by moving slit technology. In order to find out whether the phase calculated from a measured Wigner distribution can be trusted, we add a known spherical aberration to a Helium Noen laser by a plan-convex collimating lens orientated "the wrong way." The magnitude of the aberration can be influenced by the beam diameter at the lens. The M²-values calculated from the Wigner distribution of the aberrated beam at different levels of aberration is in agreement with theory. The coefficient of spherical aberration obtained from the measurement agrees with the one predicted by aberration theory if the impact of the aberration on the beam profiles is large enough (M² > 1.2). The Wigner distribution of a tapered semiconductor laser is also examined. The measured phase at the semiconductor facet is aberrated. The aberration however can not be identified to origin from exit of the beam from high index semiconductor to air through a planar interface.

Citation Download Citation

Bert J. Neubert, Wolf-Dieter Scharfe, and Guenter Huber "Measurement of the Wigner distribution of a helium neon laser with a spherical aberration and a tapered semiconductor laser using moving slit technology", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.472046

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available