Paper
30 May 2003 Practical absolute wavelength meter using iodine-stabilized diode laser
Yoshiaki Akimoto, Lee Yong-Chol, Satoshi Hatano, Shoji Niki, Akiyoshi Irisawa
Author Affiliations +
Abstract
A practical absolute wavelength meter was assembled separately a reference wavelength source and wavelength measurement system. The frequency (wavelength) stability was obtained to be 2×10-12 for a reference wavelength source. The other hand accuracy of wavelength measurement was estimated to be ** Michelson interferometer with vacuum chamber. The wavelength was estimated to be 1523.48813 nm for a 1523nm He-Ne laser as test laser. Moreover, the pressure dependence for wavelength was measured to be 0.0044 [pm/hPa]. Measurement reproducibility of the wavelength meter was guaranteed to be ±0.035pm.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoshiaki Akimoto, Lee Yong-Chol, Satoshi Hatano, Shoji Niki, and Akiyoshi Irisawa "Practical absolute wavelength meter using iodine-stabilized diode laser", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.472399
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Cited by 1 scholarly publication.
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KEYWORDS
Semiconductor lasers

Wavefront sensors

Iodine cells

Michelson interferometers

Signal processing

Laser stabilization

Interferometers

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