Paper
17 October 2003 F2-laser micropatterning of chrome-coated CaF2 for vacuum-ultraviolet masks
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Abstract
Chrome-on-quartz optics serve multi-functions including high-resolution masks for UV lithography. At the next node down, F2-laser lithography demands alternate high-transparency substrates such as wide-bandgap CaF2. We present here a direct-write method of F2-laser ablation for selective removal of 110-nm thick chrome films on CaF2 and SiO2 (fused silica) substrates. Laser-processing parameters are presented for micropatterning of the chrome film with minimal damage to the underlying substrates. Damage thresholds, ablations rates, incubation processes, and surface morphology of the chrome and CaF2 are described together with methods that reduce ablation debris and collateral damage. Laser-patterned masks are tested in a 157-nm optical projection system at 30-mJ/cm2 fluence for sub-micron laser structuring of glass and other materials.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew Yick, Jianzhao Li, and Peter R. Herman "F2-laser micropatterning of chrome-coated CaF2 for vacuum-ultraviolet masks", Proc. SPIE 4977, Photon Processing in Microelectronics and Photonics II, (17 October 2003); https://doi.org/10.1117/12.479538
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Laser ablation

Photomasks

Fluorine

Etching

Silica

Glasses

Microscopes

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