Paper
15 January 2003 Process conditions and lithographic performance of arch durimide polyimides in the ultra-thick film regime
Sylvain Irenee Misat, Rudy J. M. Pellens, Rutger Voets, Angelique van Klaveren, Jean-Paul van den Heuvel, L. Peterson, Pamela J. Waterson, D. Racicot, D. Roza
Author Affiliations +
Proceedings Volume 4979, Micromachining and Microfabrication Process Technology VIII; (2003) https://doi.org/10.1117/12.478241
Event: Micromachining and Microfabrication, 2003, San Jose, CA, United States
Abstract
Paper pending release of an erratum.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sylvain Irenee Misat, Rudy J. M. Pellens, Rutger Voets, Angelique van Klaveren, Jean-Paul van den Heuvel, L. Peterson, Pamela J. Waterson, D. Racicot, and D. Roza "Process conditions and lithographic performance of arch durimide polyimides in the ultra-thick film regime", Proc. SPIE 4979, Micromachining and Microfabrication Process Technology VIII, (15 January 2003); https://doi.org/10.1117/12.478241
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Semiconducting wafers

Lithography

Microelectromechanical systems

Coating

Packaging

Critical dimension metrology

Polymers

Back to Top